G00500 - SEMI G5 - Standard for Ceramic Chip Carriers Revision:SEMI G5-87 - Inactive although the test procedure may

although the test procedure may prove useful in corrosion studies

SEMI E6-0914 (technical revision)

which will reference performance and method standards as well as recommended practices

A unique identification of manufacturer and its location has to be part of this code

3  This Test Method can be used for silicon in which the boron contamination is greater than two times the SIMS detection limits that is approximately between 5 × 1012 atoms/cm3 and 5 × 1013 atoms/cm3 depending upon the instrumentation type

G00500 - SEMI G5 - Standard for Ceramic Chip Carriers Revision:SEMI G5-87 - Inactive although the test procedure mayNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This Specification defines the acceptance criteria for co fired, ceramic chip carriers both leaded and lead less. Referenced SEMI Standards (purchase separately) SEMI G8 Test Method for Gold Plating Quality SEMI G25 Test