Smarter Sensors, Smarter Fabs: AI at the Edge in Semiconductor Manufacturing - Materials StdPbc-0212 SEMI P45-1218 (technical revision)

SEMI P45-1218 (technical revision)

Aloft Austin South

The model specified in this Specification is used in conjunction with the Sensor/Actuator Network Common Device Model (CDM) to completely describe the EPD as it appears from the network interface

defining the sample temperature for the density measurement and specifying the number of significant figures to which the resulting measurement should be measured by the user and reported in the corresponding Certificate of Analysis (CoA) from the supplier

both suppliers and their customers may uniformly define product characteristics and quality requirements

Smarter Sensors, Smarter Fabs: AI at the Edge in Semiconductor Manufacturing - Materials StdPbc-0212 SEMI P45-1218 (technical revision)