T01000 - SEMI T10 - 二次元データマトリクス直接マーク品質を評価する試験方法 Revision:SEMI T10-0701 (Reapproved 0912) - Superseded ULSI and other devices have

ULSI and other devices have been increasingly miniaturized and integrated

SEMI E142-0224E (editorial revision)

storage or archiving of substrate maps

This specification defines the materials and acceptance criteria for high-temperature

It is based on the fundamental belief that specifications should facilitate the movement toward processed-in quality instead of inspected-in quality

T01000 - SEMI T10 - 二次元データマトリクス直接マーク品質を評価する試験方法 Revision:SEMI T10-0701 (Reapproved 0912) - Superseded ULSI and other devices haveglobal Traceability Technical Committee2012830global Audits and Reviews Subcommittee20129www. semiviews. org www. semi. org2001720073 , Referenced SEMI Standards None.