T02000 - SEMI T20 - Specification for Authentication of Semiconductors and Related Products StdPbc-0415 The purpose of this Document

The purpose of this Document is to provide a standardized methodology and procedure for measuring the particle contribution performance of a gas delivery system in terms of number of particles added to gas flowing through the system

This Test Method is intended for use on silicon substrates and epitaxial layers

such as XML schema

SEMI M77-1015 (technical revision)

dual-in-line

T02000 - SEMI T20 - Specification for Authentication of Semiconductors and Related Products StdPbc-0415 The purpose of this DocumentLarge quantities of semiconductor device products are distributed in the business world to be embedded into various electronics products such as television sets, computers, automobiles or their components, and so on. The electronic component supply network is frequently contaminated by counterfeit and tainted product. The risk of procuring contaminated goods increases when authorized (certified) distribution networks run out of product. This may occur