E08400 - SEMI E84 - Specification for Enhanced Carrier Handoff Parallel I/O Interface StdPbc-0816 The scope of this Standard

The scope of this Standard is limited to defining the behavior of Metrology equipment as perceived by a SEMI Equipment Communications Standard 2 Message Content (SECS-II) host that complies with the SEMI E30 model

SEMI MF1569-94 (Reapproved 1999) (first SEMI publication)

SEMI D58-0823 (technical revision)

This Standard describes a specific device structure and behavior of a generic equipment networked sensor

2  This Specification addresses assembly and packaging including the testing of semiconductor devices

E08400 - SEMI E84 - Specification for Enhanced Carrier Handoff Parallel I/O Interface StdPbc-0816 The scope of this StandardDue to the migration to large wafer sizes, future semiconductor factories will use extensive automated material handling systems (AMHS) to transfer wafer carriers, including FOUPs and open cassettes, of increasing weight. The parallel input output (PI O) control signals between the production equipment and the AMHS must be better defined for more reliable and efficient carrier handoffs (load unload) at production equipment load ports. The purpose of