P00200 - SEMI P2 - ハードサーフェス・フォトマスク用クロムブランク StdPbc-0713 Determining the root cause of

Determining the root cause of TDDB results is beyond the scope of this Test Method

different users may arrive at different estimates of costs because their computations may contain different elements

This Test Method covers the determination of total oxygen concentration in the bulk of single crystal silicon substrates using SIMS

SEMI MS4-1107 (first published)

it should be discussed beforehand with the customer

P00200 - SEMI P2 - ハードサーフェス・フォトマスク用クロムブランク StdPbc-0713 Determining the root cause ofNOTICE: This translation is a REFERENCE COPY ONLY. If differences should exist between the English version and a translation in any other language, the English version is the official and authoritative version. SEMI SEMI global Micropatterning Committee2008118global Audits and Reviews Subcommittee20082www. semi. org1998 NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met.