Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-64721 Its importance is due to

Its importance is due to the protection role it plays

PD CEN/TR 15449-1 is the first part of the multiple series document that provides a reference model for a Spatial Data Infrastructure (SDI)

BS EN 60034-15 provides manufacturers with the impulse voltage withstand levels

This British Standard supersedes BS 5703-1:1980

Radon is a radioactive trace gas produced by the decay of 226Ra

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-64721 Its importance is due toWhat is BS EN IEC 60749 13 Salt atmosphere test for semiconductor devices about? BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749 13 is the 13th part of the series that describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. BS EN IEC 60749 13 is only