Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy are tested in a tensile

are tested in a tensile testing machine after air conditioning or soaking with water

BS EN 2311 specifies the required characteristics

pores that have been covered over by a very thin layer

The ISO 17572 series specifies two different LRMs:

When a tyre is no longer safe or efficient to reuse

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level has-hardcopy are tested in a tensile1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and