Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 Television service providers

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and interpreting the data generated by near field scan (NFS) measurement

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Tables where the structure is intended to support a parasol

This standard has been written for manufacturers of health software

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 Television service providers1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.