Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution not-for-sale EN 1514‑6 and prEN 1514-8

EN 1514‑6 and prEN 1514-8

Easy-to-implement: in order to ensure a rapid uptake by stakeholders of learning

It is currently limited to steels with sufficient ductility but it is

BS EN 15960:2011 supersedes DD CEN/TS 15960:2009

Weakening effects need to be minimized and damage to bottles

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution not-for-sale EN 1514‑6 and prEN 1514-81 Scope This International Standard describes three methods for measuring the lateral resolution achievable in Auger electron spectrometers and X ray photoelectron spectrometers under defined settings. The straight edge method is suitable for instruments where the lateral resolution is expected to be larger than 1 m. The grid method is suitable if the lateral resolution is expected to be less than 1 m but more than 20 nm. The gold island method is