Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 - Engineering service installation rooms

- Engineering service installation rooms

Gives testing procedures for the measurement of interoperable performance

Secondary use cases

ISO 14064‑1 includes requirements and guidance on inventory quality management

hence to its mass (see also 7

Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 - Engineering service installation roomsWhat is this standard about? This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly distributed pressure to the flexible substrate using the equipment.