Semiconductor devices. Micro-electromechanical devices - Bulge test method for measuring mechanical properties of thin films Ingestion-build-183098 What is BS 11000-2

What is BS 11000-2

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Semiconductor devices. Micro-electromechanical devices - Bulge test method for measuring mechanical properties of thin films Ingestion-build-183098 What is BS 11000-2What is BS EN 62047 17 Mechanical properties of thin films about? BS EN 62047 17 is the 17th part of an international standard used for semiconductor devices. BS EN 62047 17 specifies the method for performing bulge tests on the free standing film that is bulged within a window. The specimen is fabricated with micro nano structural film materials, including metal, ceramic and polymer films, for MEMS, micromachines and others. The thickness of the film